63 pending office actions • 25 art units • 57 examiners • 0 of 63 (0%) have an AI response strategy ready • 240 patents granted in the last 365 days
Based on the USPTO statutory response window for each pending office action. 63 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.
Every pending office action with a known statutory deadline, placed on a days-until-due axis. Dots left of Today are overdue; the further right, the more runway. Cases that share a deadline window stack vertically. 63 of the docket's apps have a known mailing date.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §101 only | 2 (3%) |
| §103 only | 49 (78%) |
| §102 only | 10 (16%) |
| §112 only | 1 (2%) |
| No statute on record | 1 (2%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| PETERSON, ERIK T | 2 | 76.9% | +11.8% |
| SHOOK, DANIEL P | 2 | 86.9% | +8.5% |
| MEHTA, RATISHA | 2 | 89.5% | +6.4% |
| HELBERG, DAVID MICHAEL | 2 | 60.0% | +57.1% |
| KIM, JAY C | 2 | 48.8% | +22.3% |
| ANGEBRANNDT, MARTIN J | 2 | 55.2% | +34.5% |
| CULBERT, CHRISTOPHER A | 1 | 41.5% | +4.9% |
| LUONG, DUY HAN | 1 | 93.1% | +11.8% |
| LINDSAY, BERNARD G | 1 | 68.8% | +46.6% |
| HE, AMY | 1 | 81.4% | +4.0% |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 6 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18379668 | Semiconductor Device and Fabricating Method Thereof | MEHTA, RATISHA | 44d overdue |
| 18432073 | CAPACITANCE MEASUREMENT METHOD FOR A CAPACITIVE DEVICE | HE, AMY | 3d overdue |
| 18534754 | SEMICONDUCTOR STRUCTURE AND FABRICATION METHOD THEREOF | MEHTA, RATISHA | 7d |
| 18581327 | Static Random Access Memory | LUONG, DUY HAN | 23d |
| 18403657 | Semiconductor structure | SHOOK, DANIEL P | 33d |
| 18406225 | SEMICONDUCTOR STRUCTURE AND FABRICATION METHOD THEREOF | SHOOK, DANIEL P | 35d |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 2 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 17866595 | EXECUTION METHOD OF ONLINE DISCUSSION BOARD AND SERVER USING THE SAME | LAKHANI, ANDREW C | 149d overdue |
| 18433511 | FAULT DETECTION METHOD FOR DETECTING BEHAVIOR DEVIATION OF PARAMETERS | LINDSAY, BERNARD G | 56d |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 17943169 | Laterally diffused metal-oxide- semiconductor structure | HELBERG, DAVID MICHAEL | 45d overdue |
| 18420779 | WAFER WITH TEST STRUCTURE AND METHOD OF DICING WAFER | PETERSON, ERIK T | 15d |
| 17674796 | SEMICONDUCTOR STRUCTURE WITH BACKSIDE THROUGH SILICON VIAS AND METHOD OF OBTAINING DIE IDS THEREOF | PETERSON, ERIK T | 15d |
| 18581327 | Static Random Access Memory | LUONG, DUY HAN | 23d |
| 18346279 | PHOTOMASK SET, DESIGN METHOD THEREOF, AND MANUFACTURING METHOD OF PHOTORESIST PATTERN | ANGEBRANNDT, MARTIN J | 28d |
| 18433511 | FAULT DETECTION METHOD FOR DETECTING BEHAVIOR DEVIATION OF PARAMETERS | LINDSAY, BERNARD G | 56d |
| 18167093 | PHOTOMASK STRUCTURE, SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF | ANGEBRANNDT, MARTIN J | 57d |
| 18365245 | MEMORY STRUCTURE AND MANUFACTURING METHOD THEREOF | HELBERG, DAVID MICHAEL | 82d |
| Art Unit | Apps |
|---|---|
| 2893 | 8 |
| 2815 | 7 |
| 2898 | 5 |
| 2817 | 5 |
| 2892 | 3 |
| 2818 | 3 |
| 2899 | 3 |
| 2812 | 3 |
| 2814 | 3 |
| 1737 | 3 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 18653933 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | CULBERT, CHRISTOPHER A | 2815 | §102 | Non-Final OA | 41d | Pending | May 02, 2024 |
| 18581327 | Static Random Access Memory | LUONG, DUY HAN | 2825 | §103 | Non-Final OA | 23d | Pending | Feb 19, 2024 |
| 18433511 | FAULT DETECTION METHOD FOR DETECTING BEHAVIOR DEVIATION OF PARAMETERS | LINDSAY, BERNARD G | 2119 | §101 | Final Rejection | 56d | Pending | Feb 06, 2024 |
| 18432073 | CAPACITANCE MEASUREMENT METHOD FOR A CAPACITIVE DEVICE | HE, AMY | 2858 | §103 | Non-Final OA | 3d overdue | Pending | Feb 05, 2024 |
| 18430585 | MEMORY DEVICE AND METHOD OF CONTROLLING EQUIVALENT RESISTANCE OF BIT LINE OR SOURCE LINE CORRESPONDING TO WORD LINE OF THE MEMORY DEVICE | TRAN, ANTHAN | 2825 | §103 | Non-Final OA | 14d | Pending | Feb 01, 2024 |
| 18420779 | WAFER WITH TEST STRUCTURE AND METHOD OF DICING WAFER | PETERSON, ERIK T | 2898 | §103 | Non-Final OA | 15d | Pending | Jan 24, 2024 |
| 18406225 | SEMICONDUCTOR STRUCTURE AND FABRICATION METHOD THEREOF | SHOOK, DANIEL P | 2896 | §103 | Non-Final OA | 35d | Pending | Jan 08, 2024 |
| 18404839 | METHOD FOR FORMING A SEMICONDUCTOR STRUCTURE | OJEH, NDUKA E | 2892 | §103 | Non-Final OA | 15d | Pending | Jan 04, 2024 |
| 18403657 | Semiconductor structure | SHOOK, DANIEL P | 2896 | §103 | Non-Final OA | 33d | Pending | Jan 03, 2024 |
| 18398227 | Layout pattern of static random-access memory | FREY, KIMBERLY NEWMAN | 2817 | §103 | Non-Final OA | 71d | Pending | Dec 28, 2023 |
| 18395654 | HIGH ELECTRON MOBILITY TRANSISTOR AND METHOD FOR FABRICATING THE SAME | TRAN, DZUNG | 2893 | §103 | Final Rejection | 71d overdue | Pending | Dec 25, 2023 |
| 18540852 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | RUCKER, BASEEMAH QADEER | 2817 | §103 | Non-Final OA | 40d | Pending | Dec 14, 2023 |
| 18534754 | SEMICONDUCTOR STRUCTURE AND FABRICATION METHOD THEREOF | MEHTA, RATISHA | 2817 | §103 | Non-Final OA | 7d | Pending | Dec 11, 2023 |
| 18523930 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | NGUYEN, NIKI HOANG | 2818 | §103 | Non-Final OA | 56d | Pending | Nov 30, 2023 |
| 18522119 | SILICON ON INSULATOR DEVICE | GRAY, AARON J | 2897 | §103 | Non-Final OA | 82d | Pending | Nov 28, 2023 |
| 18522206 | Semiconductor structure and alignment method thereof | YECHURI, SITARAMARAO S | 2893 | §103 | Non-Final OA | 22d | Pending | Nov 28, 2023 |
| 18519092 | SEMICONDUCTOR DEVICE | CHI, SUBERR L | 2893 | §103 | Non-Final OA | 34d | Pending | Nov 27, 2023 |
| 18505135 | RADIO FREQUENCY DEVICE | NGUYEN, KHIEM D | 2892 | §103 | Non-Final OA | 30d overdue | Pending | Nov 09, 2023 |
| 18504143 | MEMORY DEVICE HAVING REDUCED CIRCUIT AREA | CUNNINGHAM, KIERAN MURRAY | 2893 | §103 | Non-Final OA | 12d | Pending | Nov 07, 2023 |
| 18502103 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | NICELY, JOSEPH C | 2813 | §103 | Non-Final OA | 14d | Pending | Nov 06, 2023 |
| 18383055 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | CIESLEWICZ, ANETA B | 2893 | §103 | Non-Final OA | 70d | Pending | Oct 24, 2023 |
| 18381639 | STRUCTURE WITH CAPACITOR AND FIN TRANSISTOR AND FABRICATING METHOD OF THE SAME | JOHNSON, CHRISTOPHER A | 2899 | §103 | Non-Final OA | 1d overdue | Pending | Oct 19, 2023 |
| 18379667 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | ESKRIDGE, CORY W | 3624 | §103 | Non-Final OA | 26d | Pending | Oct 13, 2023 |
| 18379668 | Semiconductor Device and Fabricating Method Thereof | MEHTA, RATISHA | 2817 | §103 | Non-Final OA | 44d overdue | Pending | Oct 13, 2023 |
| 18372684 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | MALEK, MALIHEH | 2813 | §103 | Non-Final OA | 15d overdue | Pending | Sep 25, 2023 |
| 18369815 | MIDDLE VOLTAGE TRANSISTOR AND FABRICATING METHOD OF THE SAME | YI, CHANGHYUN | 2812 | §103 | Final Rejection | 70d | Pending | Sep 18, 2023 |
| 18467739 | TRANSISTOR STRUCTURE | SPRENGER, JAIME LYNN | 2893 | §103 | Final Rejection | 28d | Pending | Sep 15, 2023 |
| 18454815 | SILICON PHOTONICS STRUCTURE AND MANUFACTURING METHOD THEREOF | BEDTELYON, JOHN M | 2874 | §102 | Non-Final OA | 1d overdue | Pending | Aug 24, 2023 |
| 18237420 | SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF | HALL, VICTORIA KATHLEEN | 2897 | §103 | Final Rejection | 28d | Pending | Aug 24, 2023 |
| 18231806 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | SCHODDE, CHRISTOPHER A | 2898 | §103 | Non-Final OA | 23d | Pending | Aug 09, 2023 |
| 18231448 | SEMICONDUCTOR STRUCTURE | HENRY, CALEB E | 2818 | §102 | Final Rejection | 60d | Pending | Aug 08, 2023 |
| 18365245 | MEMORY STRUCTURE AND MANUFACTURING METHOD THEREOF | HELBERG, DAVID MICHAEL | 2815 | §102 | Final Rejection | 82d | Pending | Aug 04, 2023 |
| 18224050 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | SALAZ, SAMMANTHA KATELYN | 2892 | §103 | Non-Final OA | 13d | Pending | Jul 19, 2023 |
| 18223539 | THREE-DIMENSIONAL INTEGRATED CIRCUIT STRUCTURE | VALENZUELA, PATRICIA D | 2812 | §103 | Non-Final OA | 14d | Pending | Jul 18, 2023 |
| 18221404 | HIGH ELECTRON MOBILITY TRANSISTOR AND METHOD FOR FABRICATING THE SAME | KIM, JAY C | 2815 | §112 | Non-Final OA | 83d | Pending | Jul 13, 2023 |
| 18221396 | HIGH ELECTRON MOBILITY TRANSISTOR AND METHOD FOR FABRICATING THE SAME | KIM, JAY C | 2815 | §103 | Final Rejection | 86d | Pending | Jul 13, 2023 |
| 18218602 | RESISTIVE MEMORY DEVICE AND MANUFACTURING METHOD THEREOF | PRENTY, MARK V | 2814 | §102 | Non-Final OA | 28d | Pending | Jul 06, 2023 |
| 18346279 | PHOTOMASK SET, DESIGN METHOD THEREOF, AND MANUFACTURING METHOD OF PHOTORESIST PATTERN | ANGEBRANNDT, MARTIN J | 1737 | §103 | Non-Final OA | 28d | Pending | Jul 03, 2023 |
| 18143076 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | ZABEL, ANDREW JOHN | 2818 | §103 | Non-Final OA | 2d overdue | Pending | May 04, 2023 |
| 18308670 | PHOTOMASK STRUCTURE | CHACKO DAVIS, DABORAH | 1737 | Other | Non-Final OA | 33d | Pending | Apr 27, 2023 |
| 18128218 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | MIYOSHI, JESSE Y | 2898 | §102 | Final Rejection | 29d overdue | Pending | Mar 29, 2023 |
| 18127018 | METHOD FOR PREDICTING ETCHING RECIPE AND SYSTEM THEREOF | ADMASU, MAHLIET TASEW | 2123 | §103 | Non-Final OA | 23d overdue | Pending | Mar 28, 2023 |
| 18124591 | INTEGRATED CIRCUIT AND MANUFACTURING METHOD THEREOF | RAMOS-DIAZ, FERNANDO JOSE | 2814 | §102 | Final Rejection | 4d overdue | Pending | Mar 22, 2023 |
| 18123995 | SEMICONDUCTOR DEVICE HAVING ANISOTROPIC LAYER | TRICE III, WILLIAM CLARENCE | 2893 | §103 | Final Rejection | 71d | Pending | Mar 21, 2023 |
| 18119797 | METASURFACE STRUCTURE AND FABRICATION METHOD THEREOF | SWANSON, WALTER H | 2815 | §103 | Final Rejection | 13d | Pending | Mar 09, 2023 |
| 18167093 | PHOTOMASK STRUCTURE, SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF | ANGEBRANNDT, MARTIN J | 1737 | §103 | Non-Final OA | 57d | Pending | Feb 10, 2023 |
| 18080688 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | ENAD, CHRISTINE A | 2811 | §103 | Final Rejection | 24d overdue | Pending | Dec 13, 2022 |
| 18074533 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | CHOU, SHIH TSUN A | 2811 | §102 | Final Rejection | 35d | Pending | Dec 05, 2022 |
| 18075383 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | TRAN, TIEN | 2812 | §103 | Non-Final OA | 79d | Pending | Dec 05, 2022 |
| 17994382 | SEMICONDUCTOR DEVICE | ANGUIANO, MICHAEL | 2899 | §103 | Final Rejection | 71d | Pending | Nov 27, 2022 |
| 17994007 | Semiconductor structure and the forming method thereof | KHALIFA, MOATAZ | 2817 | §103 | Non-Final OA | 25d overdue | Pending | Nov 25, 2022 |
| 17950120 | SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME | WRIGHT, TUCKER J | 2891 | §102 | Final Rejection | 29d | Pending | Sep 22, 2022 |
| 17943169 | Laterally diffused metal-oxide- semiconductor structure | HELBERG, DAVID MICHAEL | 2815 | §103 | Final Rejection | 45d overdue | Pending | Sep 12, 2022 |
| 17887530 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | CULLEN, PATRICK LAWRENCE | 2899 | §103 | Non-Final OA | 23d | Pending | Aug 15, 2022 |
| 17886491 | Semiconductor Structure with Features of D-mode and E-mode GaN Devices and Semiconductor Process Thereof | ROLAND, CHRISTOPHER M | 2893 | §103 | Final Rejection | 29d overdue | Pending | Aug 12, 2022 |
| 17885574 | HEMT WITH INSULATING LAYER BETWEEN GATE ELECTRODE AND CAP LAYER AND FABRICATING METHOD OF THE SAME | CHEN, DAVID Z | 2815 | §103 | Final Rejection | 6d | Pending | Aug 11, 2022 |
| 17878924 | MICROELECTROMECHANICAL SYSTEM (MEMS) MICROPHONE AND FABRICATION METHOD THEREOF | HANUMASAGAR, SHAMITA S | 2814 | §103 | Final Rejection | 121d overdue | Pending | Aug 02, 2022 |
| 17876467 | RESISTOR STRUCTURE AND METHOD FOR FABRICATING THE SAME | STEPHENSON, KENNETH STEPHEN | 2898 | §103 | Final Rejection | 31d overdue | Pending | Jul 28, 2022 |
| 17866595 | EXECUTION METHOD OF ONLINE DISCUSSION BOARD AND SERVER USING THE SAME | LAKHANI, ANDREW C | 3629 | §101 | Final Rejection | 149d overdue | Pending | Jul 18, 2022 |
| 17836992 | PHOTOMASK DESIGN CORRECTION METHOD | ALAWDI, ANWER AHMED | 2851 | §103 | Final Rejection | 60d overdue | Pending | Jun 09, 2022 |
| 17736071 | TRANSISTOR STRUCTURE AND MANUFACTURING METHOD THEREOF | PURVIS, SUE A | 2800 | §102 | Final Rejection | 322d overdue | Pending | May 03, 2022 |
| 17674796 | SEMICONDUCTOR STRUCTURE WITH BACKSIDE THROUGH SILICON VIAS AND METHOD OF OBTAINING DIE IDS THEREOF | PETERSON, ERIK T | 2898 | §103 | Final Rejection | 15d | Pending | Feb 17, 2022 |
| 17072073 | YIELD RATE PREDICTION METHOD, YIELD RATE PREDICTION SYSTEM AND MODEL TRAINING DEVICE OF SEMICONDUCTOR MANUFACTURING PROCESS | LIANG, LEONARD S | 2857 | §103 | Non-Final OA | 26d | Pending | Oct 16, 2020 |
IP Author helps IP teams respond to office actions faster with AI-generated responses, examiner analytics, and prosecution intelligence.
Start Free Trial