171 pending office actions • 7 clients
| Client (Assignee) | Pending OAs |
|---|---|
| Intel Corporation | 161 |
| Intel Corporation | 4 |
| USNR, LLC | 2 |
| Verve Group Inc. | 1 |
| Norwood Industries Inc. | 1 |
| Apera Al Inc. | 1 |
| Intel Corporation | 1 |
| App # | Title | Client | Examiner | Art Unit | Status | Filed |
|---|---|---|---|---|---|---|
| 19033078 | INTEGRATED CIRCUIT PACKAGE HAVING WIREBONDED MULTI-DIE STACK | Intel Corporation | MUNOZ, ANDRES F | 2818 | Non-Final OA | Jan 21, 2025 |
| 18896711 | PRIVACY SUPPORTING MESSAGING SYSTEMS AND METHODS | Verve Group Inc. | STRAUB, D'ARCY WINSTON | 2491 | Non-Final OA | Sep 25, 2024 |
| 18732408 | TILT HOISTS AND LUMBER UNSTACKING SYSTEMS | USNR, LLC | ADAMS, GREGORY W | 3652 | Final Rejection | Jun 03, 2024 |
| 18654739 | SAWMILL CARRIAGE, SAWMILL CARRIAGE KIT, AND METHOD OF USING SAME | Norwood Industries Inc. | LEE, LAURA MICHELLE | 3724 | Non-Final OA | May 03, 2024 |
| 18611534 | GLASS CORE PATCH WITH IN SITU FABRICATED FAN-OUT LAYER TO ENABLE DIE TILING APPLICATIONS | Intel Corporation | SENGDARA, VONGSAVANH | 2893 | Non-Final OA | Mar 20, 2024 |
| 18438450 | INTEGRATED TOP SIDE POWER DELIVERY THERMAL TECHNOLOGY | Intel Corporation | VALENZUELA, PATRICIA D | 2812 | Non-Final OA | Feb 10, 2024 |
| 18400761 | MICROELECTRONIC STRUCTURES INCLUDING BRIDGES | Intel Corporation | PIZARRO CRESPO, MARCOS D | 2814 | Non-Final OA | Dec 29, 2023 |
| 18390952 | GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES FABRICATED USING ALTERNATE ETCH SELECTIVE MATERIAL | Intel Corporation | KOO, LAMONT B | 2813 | Non-Final OA | Dec 20, 2023 |
| 18391023 | SINGLE DAMASCENE VIA PROFILES FOR ADVANCED INTEGRATED CIRCUIT STRUCTURE FABRICATION | Intel Corporation | KARIMY, TIMOR | 2818 | Non-Final OA | Dec 20, 2023 |
| 18543784 | CONTACT OVER ACTIVE GATE STRUCTURES WITH CONDUCTIVE GATE TAPS FOR ADVANCED INTEGRATED CIRCUIT STRUCTURE FABRICATION | Intel Corporation | CHOI, CALVIN Y | 2812 | Non-Final OA | Dec 18, 2023 |
| 18523592 | PHOTONIC SYSTEM WITH MARKER TONE | Intel Corporation | SINGH, DALZID E | 2635 | Non-Final OA | Nov 29, 2023 |
| 18521694 | OPTICAL COUPLER WITH DIFFERENT WAVEGUIDE MATERIALS | Intel Corporation | TAVLYKAEV, ROBERT FUATOVICH | 2896 | Non-Final OA | Nov 28, 2023 |
| 18521734 | OPTICAL COUPLER WITH DIFFERENT WAVEGUIDE MATERIALS | Intel Corporation | WONG, ERIC K | 2874 | Non-Final OA | Nov 28, 2023 |
| 18496672 | OPTICAL MODE CONVERTOR | Intel Corporation | PENG, CHARLIE YU | 2874 | Non-Final OA | Oct 27, 2023 |
| 18383370 | GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING ADJACENT DEEP VIA SUBSTRATE CONTACTS FOR SUB-FIN ELECTRICAL CONTACT | Intel Corporation | TRAN, TAN N | 2812 | Non-Final OA | Oct 24, 2023 |
| 18376341 | BGA STIM PACKAGE ARCHITECTURE FOR HIGH PERFORMANCE SYSTEMS | Intel Corporation | BOYLE, ABBIGALE A | 2899 | Final Rejection | Oct 03, 2023 |
| 18375858 | CHANNEL DEPOPULATION FOR FORKSHEET TRANSISTORS | Intel Corporation | VERDES, RICKY | 2898 | Non-Final OA | Oct 02, 2023 |
| 18374603 | SELECTIVE DIELECTRIC GROWTH FOR DIRECTING CONTACT TO GATE OR CONTACT TO TRENCH CONTACT | Intel Corporation | MICHAUD, ROBERT J | 2622 | Non-Final OA | Sep 28, 2023 |
| 18374582 | INTEGRATING AND ACCESSING PASSIVE COMPONENTS IN WAFER-LEVEL PACKAGES | Intel Corporation | SYLVIA, CHRISTINA A | 2817 | Non-Final OA | Sep 28, 2023 |
| 18372542 | MICROELECTRONICS PACKAGE COMPRISING A PACKAGE-ON-PACKAGE (POP) ARCHITECTURE WITH INKJET BARRIER MATERIAL FOR CONTROLLING BONDLINE THICKNESS AND POP ADHESIVE KEEP OUT ZONE | Intel Corporation | CHIN, EDWARD | 2893 | Non-Final OA | Sep 25, 2023 |
| 18244689 | PACKAGED SEMICONDUCTOR DIE WITH BUMPLESS DIE-PACKAGE INTERFACE FOR BUMPLESS BUILD-UP LAYER (BBUL) PACKAGES | Intel Corporation | STARK, JARRETT J | 2898 | Final Rejection | Sep 11, 2023 |
| 18459184 | INTEGRATED SILICON (SI) TUNABLE LASER | Intel Corporation | RADKOWSKI, PETER | 2874 | Non-Final OA | Aug 31, 2023 |
| 18352111 | PRECUT PROCESSING OF LOGS | USNR, LLC | LINDSAY, BERNARD G | 2119 | Final Rejection | Jul 13, 2023 |
| 18271791 | NOVEL DESIGN FOR FIBER ARRAY UNIT (FAU) FOR OPTICAL TRANSCEIVER PRODUCTS | Intel Corporation | TRAN, HOANG Q | 2874 | Final Rejection | Jul 11, 2023 |
| 18216275 | TECHNIQUES FOR DIE TILING | Intel Corporation | JUNGE, BRYAN R. | 2897 | Non-Final OA | Jun 29, 2023 |
| 18037517 | METHOD AND SYSTEM FOR IMAGE PROCESSING USING A VISION PIPELINE | Apera Al Inc. | WALLACE, JOHN R | 2682 | Non-Final OA | May 17, 2023 |
| 18130328 | METHOD TO ACHIEVE TILTED PATTERNING WITH A THROUGH RESIST THICKNESS USING PROJECTION OPTICS | Intel Corporation | ABDELAZIEZ, YASSER A | 2898 | Final Rejection | Apr 03, 2023 |
| 18193231 | CXL-CACHE/MEM PROTOCOL INTERFACE (CPI) LATENCY REDUCTION MECHANISM | Intel Corporation | LIN, AMIE CHINYU | 2436 | Non-Final OA | Mar 30, 2023 |
| 18126857 | INTEGRATED CIRCUIT STRUCTURE WITH BACKSIDE SOURCE OR DRAIN CONTACT SELECTIVITY | Intel Corporation | WARD, DAVID WILLIAM | 2891 | Non-Final OA | Mar 27, 2023 |
| 18177426 | PHASE CURRENT BALANCE ARCHITECTURE FOR A MULTI-PHASE POWER CONVERTER | Intel Corporation | PHAN, RAYMOND NGAN | 2175 | Non-Final OA | Mar 02, 2023 |
| 18174007 | NANORIBBON-BASED TRANSISTORS WITH ETCH STOP LAYER TO ASSIST SUBFIN REMOVAL | Intel Corporation | GARCES, NELSON Y | 2814 | Non-Final OA | Feb 24, 2023 |
| 18091970 | PROCESS-VOLTAGE-TEMPERATURE TOLERANT REPLICA FEEDBACK PULSE GENERATOR CIRCUIT FOR PULSED LATCH | Intel Corporation | O TOOLE, COLLEEN J | 2849 | Non-Final OA | Dec 30, 2022 |
| 18091207 | CHARGE ISOLATION ARCHITECTURE IN VOLTAGE REGULATOR FOR IMPROVED BATTERY LIFE, RESPONSIVENESS AND REDUCED ACOUSTIC NOISE | Intel Corporation | NGUYEN, PHIL K | Non-Final OA | Dec 29, 2022 | |
| 18090822 | INTEGRATED CIRCUIT STRUCTURES HAVING VERTICAL SHARED GATE HIGH-DRIVE THIN FILM TRANSISTORS | Intel Corporation | KIM, TONG-HO | 2811 | Non-Final OA | Dec 29, 2022 |
| 18091034 | PATTERNED SHEET MUF FOR COMPLEX PACKAGES AND METHODS OF PRODUCING | Intel Corporation | FERNANDES, ERROL V | 2893 | Non-Final OA | Dec 29, 2022 |
| 18090807 | INTEGRATED CIRCUIT STRUCTURES HAVING LAYER SELECT TRANSISTORS FOR SHARED PERIPHERALS IN MEMORY | Intel Corporation | LINDSEY, COLE LEON | 2812 | Non-Final OA | Dec 29, 2022 |
| 18091028 | ULTRATHIN LAMINATED GLASS AND GLASS STIFFENERS FOR CORELESS PACKAGES | Intel Corporation | SAMPLE, DAVID R | 1784 | Non-Final OA | Dec 29, 2022 |
| 18090816 | INTEGRATED CIRCUIT STRUCTURES HAVING BIT-COST SCALING WITH RELAXED TRANSISTOR AREA | Intel Corporation | PAGE, STEVEN MITCHELL CHR | 2812 | Non-Final OA | Dec 29, 2022 |
| 18091022 | ENABLING COPPER RECESS FLATTENING THROUGH A DFR PATTERNING PROCESSES | Intel Corporation | JOHNSON, CHRISTOPHER A | 2899 | Non-Final OA | Dec 29, 2022 |
| 18089931 | DEVICES IN A SILICON CARBIDE LAYER COUPLED WITH DEVICES IN A GALLIUM NITRIDE LAYER | Intel Corporation | LOHAKARE, PRATIKSHA JAYANT | 2818 | Non-Final OA | Dec 28, 2022 |
| 18089877 | INTEGRATED CIRCUIT STRUCTURES HAVING LOOKUP TABLE DECODERS FOR FPGAS | Intel Corporation | JEFFERSON, QUOVAUNDA | 2899 | Non-Final OA | Dec 28, 2022 |
| 18089957 | DYNAMIC RANDOM-ACCESS MEMORY USING WIDE BAND GAP MATERIALS | Intel Corporation | HALL, VICTORIA KATHLEEN | 2897 | Non-Final OA | Dec 28, 2022 |
| 18089908 | INTEGRATED CIRCUIT STRUCTURES HAVING STACKED ELECTROSTATIC DISCHARGE (ESD) FOR BACKSIDE POWER DELIVERY | Intel Corporation | VU, HUNG K | 2897 | Non-Final OA | Dec 28, 2022 |
| 18089865 | INTEGRATED CIRCUIT STRUCTURES HAVING TWO-LEVEL MEMORY | Intel Corporation | LIU, BENJAMIN T | 2893 | Non-Final OA | Dec 28, 2022 |
| 18089476 | THIN FILM CAPACITORS (TFCS) IN ETCHED BACK DEEP VIA | Intel Corporation | LOPEZ, JORGE ANDRES | 2897 | Non-Final OA | Dec 27, 2022 |
| 18089471 | THIN FILM CAPACITOR (TFC) ARCHITECTURES FOR PACKAGE SUBSTRATES | Intel Corporation | PAYEN, MARVIN | 2899 | Non-Final OA | Dec 27, 2022 |
| 18089491 | LIQUID METAL WELLS FOR INTERCONNECT ARCHITECTURES | Intel Corporation | WOLDEGEORGIS, ERMIAS T | 2893 | Non-Final OA | Dec 27, 2022 |
| 18089489 | SUBSTRATE GLASS CORE PATTERNING FOR CTV IMPROVEMENT AND LAYER COUNT REDUCTION | Intel Corporation | ESTRADA, ANGEL R | 2841 | Non-Final OA | Dec 27, 2022 |
| 18089494 | DIRECT ELECTROPLATING ON MODIFIED POLYMER-GRAPHENE COMPOSITES | Intel Corporation | MILLER, JAMI VALENTINE | 2818 | Non-Final OA | Dec 27, 2022 |
| 18089501 | FUNCTIONALLY GRADED INDEX MOLD FOR CO-PACKAGED OPTICAL APPLICATIONS | Intel Corporation | CHIEM, DINH D | 2874 | Non-Final OA | Dec 27, 2022 |
| 18089483 | TSV-TYPE EMBEDDED MULTI-DIE INTERCONNECT BRIDGE ENABLING WITH THERMAL COMPRESSION NON-CONDUCTIVE FILM (TC-NCF) PROCESS | Intel Corporation | FERNANDES, ERROL V | 2893 | Non-Final OA | Dec 27, 2022 |
| 18088542 | GALLIUM NITRIDE (GAN) LAYER ON SUBSTRATE CARBURIZATION FOR INTEGRATED CIRCUIT TECHNOLOGY | Intel Corporation | TYNES JR., LAWRENCE C | 2899 | Non-Final OA | Dec 24, 2022 |
| 18088552 | INTEGRATED CIRCUIT STRUCTURES HAVING BACKSIDE CAPACITORS | Intel Corporation | BLACKWELL, ASHLEY NICOLE | 2897 | Non-Final OA | Dec 24, 2022 |
| 18088546 | GALLIUM NITRIDE (GAN) TRANSISTORS WITH LATERAL DRAIN DEPLETION | Intel Corporation | NICELY, JOSEPH C | 2813 | Non-Final OA | Dec 24, 2022 |
| 18088547 | SELF-ALIGNED BACKBONE FOR FORKSHEET TRANSISTORS | Intel Corporation | SHEKER, RHYS PONIENTE | 2813 | Non-Final OA | Dec 24, 2022 |
| 18088541 | INTEGRATED CIRCUIT STRUCTURES HAVING BACKSIDE HIGH | Intel Corporation | HO, ANTHONY | 2817 | Non-Final OA | Dec 24, 2022 |
| 18088543 | INTEGRATED CIRCUIT STRUCTURES HAVING BACKSIDE POWER DELIVERY AND SIGNAL ROUTING FOR FRONT SIDE DRAM | Intel Corporation | ARORA, AJAY | 2892 | Non-Final OA | Dec 24, 2022 |
| 18088360 | CONFIGURABLE MICRO HEAT PIPE (MHP) AND MICROCHANNEL FOR IMPROVED COOLING OF GLASS CORE SUBSTRATE | Intel Corporation | CRUM, JACOB R | 2835 | Non-Final OA | Dec 23, 2022 |
| 18069269 | ADAPTIVE VOLTAGE SHUTDOWN DEMOTION | Intel Corporation | PATEL, NIMESH G | 2176 | Non-Final OA | Dec 21, 2022 |
| 18085116 | LAYER TRANSFER CLAMP FOR GALLIUM NITRIDE (GAN) INTEGRATED CIRCUIT TECHNOLOGY | Intel Corporation | BLACKWELL, ASHLEY NICOLE | 2897 | Non-Final OA | Dec 20, 2022 |
| 18085122 | LAYER TRANSFER TRANSISTOR FOR GALLIUM NITRIDE (GAN) INTEGRATED CIRCUIT TECHNOLOGY | Intel Corporation | MILLER, JAMI VALENTINE | 2818 | Non-Final OA | Dec 20, 2022 |
| 18084275 | EMBEDDED MEMORY FOR GLASS CORE PACKAGES | Intel Corporation | FERNANDES, ERROL V | 2893 | Non-Final OA | Dec 19, 2022 |
| 18081362 | IN CORE LARGE AREA CAPACITORS | Intel Corporation | LIAN, ESTHER NGUN HLEI MA | 2847 | Non-Final OA | Dec 14, 2022 |
| 18080907 | GALLIUM NITRIDE (GAN) WITH INTERLAYERS FOR INTEGRATED CIRCUIT TECHNOLOGY | Intel Corporation | WOLDEGEORGIS, ERMIAS T | 2893 | Non-Final OA | Dec 14, 2022 |
| 18076130 | LINED CONDUCTIVE STRUCTURES FOR TRENCH CONTACT | Intel Corporation | PAGE, STEVEN MITCHELL CHR | 2812 | Non-Final OA | Dec 06, 2022 |
| 18073213 | INTEGRATED CIRCUIT STRUCTURES WITH CAVITY SPACERS | Intel Corporation | KIM, TONG-HO | 2811 | Non-Final OA | Dec 01, 2022 |
| 18072569 | INTEGRATED CIRCUIT STRUCTURE WITH RECESSED TRENCH CONTACT AND DEEP BOUNDARY VIA | Intel Corporation | FERNANDES, ERROL V | 2893 | Non-Final OA | Nov 30, 2022 |
| 18072564 | FABRICATION OF INTEGRATED CIRCUIT STRUCTURES HAVING UNIFORMITY AMONG VARYING GATE TRENCH WIDTHS | Intel Corporation | BEARDSLEY, JONAS TYLER | 2811 | Non-Final OA | Nov 30, 2022 |
| 18071901 | OVERLYING FIDUCIAL DESIGN FOR GLASS PLACEMENT ACCURACY IMPROVEMENT | Intel Corporation | RODRIGUEZ VILLANU, SANDRA MILENA | 2898 | Non-Final OA | Nov 30, 2022 |
| 18071257 | SHAPE MEMORY POLYMER (SMP) GLASS CORE PACKAGE FOR MODULATING WARPAGE | Intel Corporation | WOLDEGEORGIS, ERMIAS T | 2893 | Non-Final OA | Nov 29, 2022 |
| 18071246 | INTEGRATED OPTICAL PHASE CHANGE MATERIALS FOR RECONFIGURABLE OPTICS IN GLASS CORES | Intel Corporation | PENG, CHARLIE YU | 2874 | Non-Final OA | Nov 29, 2022 |
| 17983425 | PROVIDING HARDWARE FEEDBACK INFORMATION IN A VIRTUAL ENVIRONMENT | Intel Corporation | KESSLER, GREGORY AARON | 2197 | Non-Final OA | Nov 09, 2022 |
| 17958279 | GAIN CELL USING PLANAR AND TRENCH FERROELECTRIC AND ANTI-FERROELECTRIC CAPACITORS FOR EDRAM | Intel Corporation | IMTIAZ, S M SOHEL | 2812 | Non-Final OA | Sep 30, 2022 |
| 17958291 | PLUG BETWEEN TWO GATES OF A SEMICONDUCTOR DEVICE | Intel Corporation | PRENTY, MARK V | 2814 | Non-Final OA | Sep 30, 2022 |
| 17958281 | DESIGN OF VOLTAGE CONTRAST PROCESS MONITOR | Intel Corporation | LOPEZ, JORGE ANDRES | 2897 | Non-Final OA | Sep 30, 2022 |
| 17937212 | FORMING METAL GATE CUTS USING MULTIPLE PASSES FOR DEPTH CONTROL | Intel Corporation | KIM, TONG-HO | 2811 | Final Rejection | Sep 30, 2022 |
| 17956753 | DYNAMIC RANDOM-ACCESS MEMORY IN A MOLDING BENEATH A DIE | Intel Corporation | MENZ, DOUGLAS M | 2897 | Non-Final OA | Sep 29, 2022 |
| 17956760 | SIDE OF A DIE THAT IS COPLANAR WITH A SIDE OF A MOLDING | Intel Corporation | VU, VU A | 2897 | Final Rejection | Sep 29, 2022 |
| 17956779 | INTEGRATED CIRCUIT STRUCTURES HAVING FIN ISOLATION REGIONS RECESSED FOR GATE CONTACT | Intel Corporation | HAN, JONATHAN | 2818 | Non-Final OA | Sep 29, 2022 |
| 17955513 | INTEGRATED CIRCUIT STRUCTURES WITH UNIFORM EPITAXIAL SOURCE OR DRAIN CUT | Intel Corporation | LEE, WOO KYUNG | 2815 | Final Rejection | Sep 28, 2022 |
| 17955378 | OPTICAL COUPLER | Intel Corporation | RAHLL, JERRY T | 2874 | Non-Final OA | Sep 28, 2022 |
| 17955485 | INTEGRATED CIRCUIT STRUCTURES WITH CHANNEL CAP REDUCTION | Intel Corporation | ENAD, CHRISTINE A | 2811 | Non-Final OA | Sep 28, 2022 |
| 17955511 | MUSHROOMED VIA STRUCTURES FOR TRENCH CONTACT OR GATE CONTACT | Intel Corporation | RAHMAN, MOHAMMAD A | 2898 | Non-Final OA | Sep 28, 2022 |
| 17954288 | IMPLANTATION OF SPECIES ON GLASS CORE SURFACE FOR LOW LOSS AND HIGH STRENGTH APPLICATIONS | Intel Corporation | CHEN, YU | 2896 | Non-Final OA | Sep 27, 2022 |
| 17954292 | VERTICAL THROUGH-SILICON WAVEGUIDE FABRICATION METHOD AND TOPOLOGIES | Intel Corporation | DOAN, JENNIFER | 2874 | Non-Final OA | Sep 27, 2022 |
| 17954194 | INTEGRATED CIRCUIT STRUCTURES HAVING FIN ISOLATION REGIONS BOUND BY GATE CUTS | Intel Corporation | ENAD, CHRISTINE A | 2811 | Final Rejection | Sep 27, 2022 |
| 17953873 | HIGH ASPECT RATIO METAL GATE CUTS | Intel Corporation | TURNER, BRIAN | 2818 | Non-Final OA | Sep 27, 2022 |
| 17953206 | ELECTROLYTIC SURFACE FINISH ARCHITECTURE | Intel Corporation | ROBINSON, KRYSTAL | 2848 | Non-Final OA | Sep 26, 2022 |
| 17953210 | DFR OVERHANG PROCESS FLOW FOR ELECTROLYTIC SURFACE FINISH FOR GLASS CORE | Intel Corporation | FREAL, JOHN BRENDAN | 2847 | Non-Final OA | Sep 26, 2022 |
| 17952017 | TESTING A SEMICONDUCTOR DEVICE USING X-RAYS | Intel Corporation | HOQUE, FARHANA AKHTER | 2858 | Final Rejection | Sep 23, 2022 |
| 17951995 | ALTERING OPERATIONAL CHARACTERISTICS OF A SEMICONDUCTOR DEVICE USING ACCELERATED IONS | Intel Corporation | FAYETTE, NATHALIE RENEE | 2812 | Non-Final OA | Sep 23, 2022 |
| 17952031 | COUPLING A THERMALLY CONDUCTIVE PLATE TO A SEMICONDUCTOR DEVICE FOR ELECTRON BEAM ANALYSIS | Intel Corporation | NAVARRO, HUGO IVAN | 2858 | Non-Final OA | Sep 23, 2022 |
| 17950926 | DIELECTRIC PLUGS FOR ADVANCED INTEGRATED CIRCUIT STRUCTURE FABRICATION | Intel Corporation | HAN, JONATHAN | 2818 | Non-Final OA | Sep 22, 2022 |
| 17949857 | IC PACKAGE WITH LEDS | Intel Corporation | YEUNG LOPEZ, FEIFEI | 2899 | Non-Final OA | Sep 21, 2022 |
| 17942415 | DYNAMIC VOLTAGE AND FREQUENCY SCALING FOR MEMORY IN HETEROGENEOUS CORE ARCHITECTURES | Intel Corporation | CLEARY, THOMAS J | 2175 | Non-Final OA | Sep 12, 2022 |
| 17895916 | THROUGH GLASS VIAS (TGVS) IN GLASS CORE SUBSTRATES | Intel Corporation | AHMADI, MOHSEN | 2896 | Non-Final OA | Aug 25, 2022 |
| 17894868 | INTEGRATED CIRCUIT STRUCTURES HAVING MAGNETIC VIAS AND BACKSIDE POWER DELIVERY | Intel Corporation | TRICE III, WILLIAM CLARENCE | 2893 | Final Rejection | Aug 24, 2022 |
| 17892930 | ANGLED BAFFLES ON GLASS EDGE FOR CAVITATION PROTECTION | Intel Corporation | AMER, MOUNIR S | 2818 | Non-Final OA | Aug 22, 2022 |
| 17891738 | THERMAL MANAGEMENT OF BASE DIES IN MULTICHIP COMPOSITE DEVICES | Intel Corporation | NIELSEN, DEREK LANG | 2899 | Non-Final OA | Aug 19, 2022 |
| 17889229 | SKIP LAYER WITH AIR GAP ON GLASS SUBSTRATES | Intel Corporation | FAN, SU JYA | 2818 | Non-Final OA | Aug 16, 2022 |
| 17887273 | SACRIFICIAL LAYER FOR SUBSTRATE ANALYSIS | Intel Corporation | BODNAR, JOHN A | 2893 | Non-Final OA | Aug 12, 2022 |
| 17886278 | ALTERNATING HIGH K LAYERS ON GLASS PILLARS FOR SUPER CAPACITORS ON GLASS SUBSTRATES | Intel Corporation | CHI, SUBERR L | 2893 | Non-Final OA | Aug 11, 2022 |
| 17858031 | SEMICONDUCTOR PACKAGE HAVING PASSIVE SUPPORT WAFER | Intel Corporation | TRAN, THANH Y | 2817 | Final Rejection | Jul 05, 2022 |
| 17855639 | CONTACT ARCHITECTURE FOR 2D STACKED NANORIBBON TRANSISTOR | Intel Corporation | OH, JIYOUNG | 2818 | Final Rejection | Jun 30, 2022 |
| 17853597 | STACKED TRANSCEIVER AND WAVEGUIDE LAUNCHER ARRAY | Intel Corporation | PHAM, TUAN | 2649 | Non-Final OA | Jun 29, 2022 |
| 17850769 | FABRICATION OF GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING COMMON METAL GATES AND HAVING GATE DIELECTRICS WITH AN OPPOSITE POLARITY DIPOLE LAYER | Intel Corporation | LEE, DA WEI | 2817 | Non-Final OA | Jun 27, 2022 |
| 17850778 | INTEGRATED CIRCUIT STRUCTURE WITH BACKSIDE POWER STAPLE | Intel Corporation | HOANG, TUAN A | 2898 | Non-Final OA | Jun 27, 2022 |
| 17850078 | SELF-ASSEMBLED MONOLAYER ON A DIELECTRIC FOR TRANSITION METAL DICHALCOGENIDE GROWTH FOR STACKED 2D CHANNELS | Intel Corporation | FOX, BRANDON C | 2818 | Final Rejection | Jun 27, 2022 |
| 17850623 | STACKED SINGLE CRYSTAL TRANSITION-METAL DICHALCOGENIDE USING SEEDED GROWTH | Intel Corporation | SALAZ, SAMMANTHA KATELYN | 2892 | Final Rejection | Jun 27, 2022 |
| 17849352 | COPPER RINGS FOR BGA COUNT REDUCTION IN SMALL FORM FACTOR PACKAGES | Intel Corporation | BAIG, ANEESA RIAZ | 2814 | Final Rejection | Jun 24, 2022 |
| 17848630 | HYPER DENSITY PACKAGE SUBSTRATE AND MEMORY COUPLED TO A MODIFIED SEMI-ADDITIVE PROCESS BOARD | Intel Corporation | SRINIVASAN, SESHA SAIRAMAN | 2812 | Non-Final OA | Jun 24, 2022 |
| 17848624 | SILICON NITRIDE LAYER UNDER A COPPER PAD | Intel Corporation | CLINTON, EVAN GARRETT | 2899 | Non-Final OA | Jun 24, 2022 |
| 17841550 | DYNAMIC INPUT POWER MONITOR | Intel Corporation | YEN, PAUL JUEI-FU | 2175 | Final Rejection | Jun 15, 2022 |
| 17833580 | EMI CAGE FOR MICROSTRIP ROUTING VIA DUAL LAYER UNDERFILL CONCEPT | Intel Corporation | NGUYEN, KHIEM D | 2892 | Final Rejection | Jun 06, 2022 |
| 17833600 | MEMORY PACKAGE ON EXTENDED BASE DIE OVER SOC DIE FOR PACKAGE LAYER COUNT AND FORM FACTOR REDUCTION | Intel Corporation | ANDREWS, FELIX BRYAN | 2812 | Final Rejection | Jun 06, 2022 |
| 17833589 | MEMORY ON PACKAGE (MOP) ARCHITECTURE | Intel Corporation | LE, THAO P | 2818 | Non-Final OA | Jun 06, 2022 |
| 17833608 | ON PACKAGE INTERCONNECT ARCHITECTURE FOR HIGH-SPEED MEMORY | Intel Corporation | JUNG, MICHAEL YOO LIM | 2817 | Non-Final OA | Jun 06, 2022 |
| 17826933 | USB TYPE-C SUBSYSTEM | Intel Corporation | UNELUS, ERNEST | 2181 | Final Rejection | May 27, 2022 |
| 17743954 | DESIGNS TO ENABLE INLINE CIRCUIT EDIT | Intel Corporation | PARIHAR, SUCHIN | 2851 | Final Rejection | May 13, 2022 |
| 17743948 | INLINE CIRCUIT EDIT | Intel Corporation | AU, BAC H | 2898 | Final Rejection | May 13, 2022 |
| 17710791 | SELECTIVE PASSIVATION FOR EPI GROWTH IN PRESENCE OF METALLIC CONTACTS | Intel Corporation | FAYETTE, NATHALIE RENEE | 2812 | Non-Final OA | Mar 31, 2022 |
| 17710802 | DEVICE PERFORMANCE TUNING BY DEEP TRENCH VIA (DVB) PROXIMITY EFFECT IN ARCHITECTURE OF BACKSIDE POWER DELIVERY | Intel Corporation | ENAD, CHRISTINE A | 2811 | Non-Final OA | Mar 31, 2022 |
| 17707358 | MODIFICATION OF SINX THIN FILM FOR IMPROVED ADHESION OF METAL-DIELECTRICS FOR HSIO PACKAGING | Intel Corporation | SAWYER, STEVEN T | 2847 | Final Rejection | Mar 29, 2022 |
| 17707371 | PLASMA-INDUCED SURFACE FUNCTIONALIZATION OF SINX THIN FILM FOR IMPROVED ADHESION OF METAL-DIELECTRIC FOR HSIO | Intel Corporation | POWERS, LAURA C | 1785 | Final Rejection | Mar 29, 2022 |
| 17693150 | FABRICATION OF GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING ADDITIVE GATE STRUCTURES IN A TUB ARCHITECTURE | Intel Corporation | CRAMER, HALEE PAIGE | 2891 | Non-Final OA | Mar 11, 2022 |
| 17682804 | POWER GATE WITH METAL ON BOTH SIDES | Intel Corporation | SALERNO, SARAH KATE | 2814 | Non-Final OA | Feb 28, 2022 |
| 17561726 | SINGLE LAYER AND MULTILAYER MAGNETIC INDUCTORS BETWEEN SUBSTRATE CORES | Intel Corporation | ZARNEKE, DAVID A | 2891 | Non-Final OA | Dec 24, 2021 |
| 17561733 | 3D ARRAYED GLASS-BASED MMWAVE AND THZ STRUCTURES | Intel Corporation | TRAN, TIEN | 2812 | Non-Final OA | Dec 24, 2021 |
| 17561735 | SUSPENDED STRUCTURES IN GLASS USING MODIFIED GLASS PATTERNING PROCESSES | Intel Corporation | MCCOY, THOMAS WILSON | 2814 | Non-Final OA | Dec 24, 2021 |
| 17561670 | POWER DELIVERY USING BACKSIDE POWER FOR STITCHED DIES | Intel Corporation | ZHU, SHENG-BAI | 2897 | Final Rejection | Dec 23, 2021 |
| 17561681 | HIGH BANDWIDTH AND CAPACITY APPROACHES FOR STITCHED DIES | Intel Corporation | NGUYEN, CUONG B | 2818 | Non-Final OA | Dec 23, 2021 |
| 17561686 | GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING SOURCE OR DRAIN STRUCTURES WITH SUBSTRATE CONNECTION PORTIONS | Intel Corporation | HRNJIC, ADIN | 2817 | Non-Final OA | Dec 23, 2021 |
| 17561682 | INTEGRATED CIRCUIT STRUCTURE WITH BURIED POWER RAIL | Intel Corporation | TRICE III, WILLIAM CLARENCE | 2893 | Non-Final OA | Dec 23, 2021 |
| 17558425 | COPPER-FILLED TRENCH CONTACT FOR TRANSISTOR PERFORMANCE IMPROVEMENT | Intel Corporation | LIN, JOHN | 2815 | Final Rejection | Dec 21, 2021 |
| 17557995 | GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING SOURCE OR DRAIN STRUCTURES WITH REGROWN CENTRAL PORTIONS | Intel Corporation | NGUYEN, CUONG B | 2818 | Final Rejection | Dec 21, 2021 |
| 17558046 | GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING SOURCE OR DRAIN-LAST STRUCTURES | Intel Corporation | BERRY, PAUL ANTHONY | 2898 | Final Rejection | Dec 21, 2021 |
| 17558061 | INTEGRATED CIRCUIT STRUCTURES HAVING METAL GATE PLUG LANDED ON DIELECTRIC ANCHOR | Intel Corporation | CRAMER, HALEE PAIGE | 2891 | Non-Final OA | Dec 21, 2021 |
| 17556660 | TECHNIQUES FOR DIE TILING | Intel Corporation | JUNGE, BRYAN R. | 2897 | Non-Final OA | Dec 20, 2021 |
| 17554456 | ISO-LEVEL VIAS FOR ADVANCED INTEGRATED CIRCUIT STRUCTURE FABRICATION | Intel Corporation | MILLER, ALEXANDER MICHAEL | 2898 | Non-Final OA | Dec 17, 2021 |
| 17553189 | POWER DELIVERY TECHNIQUES FOR GLASS SUBSTRATE WITH HIGH DENSITY SIGNAL VIAS | Intel Corporation | DINH, TUAN T | 2848 | Non-Final OA | Dec 16, 2021 |
| 17553161 | INTEGRATED CIRCUIT STRUCTURES HAVING DIELECTRIC ANCHOR AND CONFINED EPITAXIAL SOURCE OR DRAIN STRUCTURE | Intel Corporation | MUNOZ, ANDRES F | 2818 | Non-Final OA | Dec 16, 2021 |
| 17553214 | COUPLED FINS WITH BLIND TRENCH STRUCTURES | Intel Corporation | MAIGA, SIDI MOHAMED | 2847 | Non-Final OA | Dec 16, 2021 |
| 17549497 | INTERPOSER WITH A GLASS CORE THAT INCLUDES OPENINGS AND THROUGH GLASS VIAS | Intel Corporation | YAP, DOUGLAS ANTHONY | 2899 | Non-Final OA | Dec 13, 2021 |
| 17548027 | INTEGRATED CIRCUIT STRUCTURES WITH TRENCH CONTACT FLYOVER STRUCTURE | Intel Corporation | ENAD, CHRISTINE A | 2811 | Final Rejection | Dec 10, 2021 |
| 17547745 | OXIDE AND CARBON LAYERS AT A SURFACE OF A SUBSTRATE FOR HYBRID BONDING | Intel Corporation | TAN, DAVE | 2897 | Final Rejection | Dec 10, 2021 |
| 17485325 | OXIDE LAYER DOPING ON A SUB CHANNEL OF A TRANSISTOR STRUCTURE | Intel Corporation | MIHALIOV, DMITRI | 2812 | Non-Final OA | Sep 25, 2021 |
| 17485198 | REPAIR AND PERFORMANCE CHIPLET | Intel Corporation | VERDES, RICKY | 2898 | Final Rejection | Sep 24, 2021 |
| 17485294 | ELIMINATION OF SUB-FIN LEAKAGE IN STACKED NANOSHEET ARCHITECTURES | Intel Corporation | NETTLES, CORALIE ANN | 2893 | Non-Final OA | Sep 24, 2021 |
| 17485217 | PHYSICAL AND ELECTRICAL PROTOCOL TRANSLATION CHIPLETS | Intel Corporation | ANDERSON, WILLIAM H | 2817 | Final Rejection | Sep 24, 2021 |
| 17484970 | TRANSISTOR STRUCTURE WITH A MONOLAYER EDGE CONTACT | Intel Corporation | RICHARDS, NORMAN DREW | 2892 | Final Rejection | Sep 24, 2021 |
| 17485232 | COMPLEX FIELD-SHAPING BY FINE VARIATION OF LOCAL MATERIAL DENSITY OR PROPERTIES | Intel Corporation | WINTERS, SEAN AYERS | 2892 | Final Rejection | Sep 24, 2021 |
| 17485185 | THIN FILM TRANSISTORS HAVING CMOS FUNCTIONALITY INTEGRATED WITH 2D CHANNEL MATERIALS | Intel Corporation | GREWAL, HEIM KIRIN | 2812 | Final Rejection | Sep 24, 2021 |
| 17481247 | DOUBLE-SIDED GLASS SUBSTRATE WITH A HYBRID BONDED PHOTONIC INTEGRATED CIRCUIT | Intel Corporation | BEDTELYON, JOHN M | 2874 | Non-Final OA | Sep 21, 2021 |
| 17481266 | GLASS SUBSTRATE EMBEDDED PIC TO PIC AND OFF-CHIP PHOTONIC COMMUNICATIONS | Intel Corporation | CHIEM, DINH D | 2874 | Final Rejection | Sep 21, 2021 |
| 17481245 | DAM SURROUNDING A DIE ON A SUBSTRATE | Intel Corporation | YASMEEN, NISHATH | 2811 | Final Rejection | Sep 21, 2021 |
| 17479155 | THIN FILM TRANSISTORS HAVING FIN STRUCTURES INTEGRATED WITH 2D CHANNEL MATERIALS | Intel Corporation | NGUYEN, CUONG B | 2818 | Final Rejection | Sep 20, 2021 |
| 17479031 | OPTICAL WAVEGUIDES WITHIN A GLASS SUBSTRATE TO OPTICALLY COUPLE DIES ATTACHED TO THE GLASS SUBSTRATE | Intel Corporation | JORDAN, ANDREW | 2874 | Final Rejection | Sep 20, 2021 |
| 17473099 | FINE BUMP PITCH DIE TO DIE TILING INCORPORATING AN INVERTED GLASS INTERPOSER | Intel Corporation | BAIG, ANEESA RIAZ | 2814 | Final Rejection | Sep 13, 2021 |
| 17357767 | SUBSTRATE-LESS NANOWIRE-BASED LATERAL DIODE INTEGRATED CIRCUIT STRUCTURES | Intel Corporation | NGUYEN, DUY T V | 2818 | Final Rejection | Jun 24, 2021 |
| 17357729 | FEATURES FOR IMPROVING DIE SIZE AND ORIENTATION DIFFERENTIATION IN HYBRID BONDING SELF ASSEMBLY | Intel Corporation | OH, JIYOUNG | 2818 | Final Rejection | Jun 24, 2021 |
| 17357722 | UNIVERSAL HYBRID BONDING SURFACE LAYER USING AN ADAPTABLE INTERCONNECT LAYER FOR INTERFACE DISAGGREGATION | Intel Corporation | CAMPBELL, SHAUN M | 2893 | Final Rejection | Jun 24, 2021 |
| 17356023 | SIGNAL AND GROUND VIAS IN A GLASS CORE TO CONTROL IMPEDANCE | Intel Corporation | WOLDEGEORGIS, ERMIAS T | 2893 | Final Rejection | Jun 23, 2021 |
| 17350184 | MILLIMETER WAVE COMPONENTS IN A GLASS CORE OF A SUBSTRATE | Intel Corporation | ANGUIANO, MICHAEL | 2899 | Non-Final OA | Jun 17, 2021 |
| 17346999 | INTEGRATED CIRCUIT STRUCTURES WITH BACKSIDE SELF-ALIGNED CONDUCTIVE VIA BAR | Intel Corporation | HANUMASAGAR, SHAMITA S | 2814 | Non-Final OA | Jun 14, 2021 |
| 17346964 | STENT AND WRAP CONTACT | Intel Corporation | BLACKWELL, ASHLEY NICOLE | 2897 | Final Rejection | Jun 14, 2021 |
| 17133080 | METAL LINE AND VIA BARRIER LAYERS, AND VIA PROFILES, FOR ADVANCED INTEGRATED CIRCUIT STRUCTURE FABRICATION | Intel Corporation | KIM, JAHAE | 2897 | Final Rejection | Dec 23, 2020 |
| 17129851 | PLATE LINE ARCHITECTURES FOR 3D-FERROELECTRIC RANDOM ACCESS MEMORY (3D-FRAM) | Intel Corporation | CORNELY, JOHN PATRICK | 2812 | Final Rejection | Dec 21, 2020 |
| 17129846 | NOVEL LGA ARCHITECTURE FOR IMPROVING RELIABILITY PERFORMANCE OF METAL DEFINED PADS | Intel Corporation | NELSON, JACOB THEODORE | 2815 | Final Rejection | Dec 21, 2020 |
| 17020200 | TANDEM MAGNETICS IN PACKAGE | Intel Corporation | CHAN, TSZFUNG JACKIE | 2837 | Final Rejection | Sep 14, 2020 |
| 16940117 | SOURCE/DRAIN CONTACTS FOR NON-PLANAR TRANSISTORS | Intel Corporation | BOULGHASSOUL, YOUNES | 2814 | Non-Final OA | Jul 27, 2020 |
| 16542960 | PITCH-DIVIDED INTERCONNECTS FOR ADVANCED INTEGRATED CIRCUIT STRUCTURE FABRICATION | Intel Corporation | MIYOSHI, JESSE Y | 2898 | Non-Final OA | Aug 16, 2019 |
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